Please use this identifier to cite or link to this item: https://gnanaganga.inflibnet.ac.in:8443/jspui/handle/123456789/14862
Title: Relating Interface Evolution to Interface Mechanics Based on Interface Properties
Authors: Devendra Verma
Sudipta Biswas
Keywords: interface evolution
connecting interface evolution
interface thickness-dependent properties.
Issue Date: 2017
Publisher: JOM
Abstract: The current article focus es on recent work done in understanding th e role ofprocessing techniques on interface evol ution and connecting interface evo lu-tion to interface thickness-dependent properties. Special emphasis is placedon interface evolution du ring the sintering process of tungsten ( W) . Sinteringwith additives s uch as nickel significan tly changes grain boundary propertiesin W, l ea ding to issues such as grain boundary em brittl e ment. When one hasto mechanically describe properties of polycrystalline W with an account of theinfluence of grain boundary embrittlement, one must explicitly consider grainboundary properti es. This issue is the focus of the present work on theme chanical properti es of interfaces . O vera ll, a phase field modeling-bas edapproach is s hown to be an excellent computational tool for predicting theinterface evolution. The influences of the interface thickness, chemistry, andorientation of phas es around interfaces are analyzed using extended finiteelement simulations for polycrystalline W
URI: http://gnanaganga.inflibnet.ac.in:8080/jspui/handle/123456789/14862
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