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Please use this identifier to cite or link to this item: https://gnanaganga.inflibnet.ac.in:8443/jspui/handle/123456789/14977
Title: The Study of Converse Piezoelectric-Effect of Zno Thin Film
Authors: Guchhait, Suman
Ahmad, Aquil
Aireddy, H
Das, Amal Kumar
Keywords: Piezoelectricity
Cantilever
Electric Power
Crystal Structure
Pulsed Laser Deposition
Atomic Force Microscopy
Polycrystalline Material
Thin Films
High Resolution X-Ray Diffraction
Public Policy and Governance
Issue Date: 2019
Publisher: AIP Conference Proceedings
American Institute of Physics Inc.
Citation: Vol. 2142
Abstract: Polycrystalline ZnO thin film has been deposited on Si cantilever beam substrate by pulsed laser deposition (PLD) technique. The high-resolution x-ray diffraction (HR-XRD) analysis suggests the formation of wurtzite structure along c-axis. The atomic force microscopy (AFM) measurement reveals the growth of a good crystalline film. We have studied the converse piezoelectric-effect of the as-deposited film from +3V to -3V dc voltage. The curve shows a butterfly type loop, which is in good agreement with available literatures. © 2019 American Institute of Physics Inc.. All rights reserved.
URI: https://dx.doi.org/10.1063/1.5122438
http://gnanaganga.inflibnet.ac.in:8080/jspui/handle/123456789/14977
ISSN: 0094-243X
Appears in Collections:Conference Papers

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