Please use this identifier to cite or link to this item: https://gnanaganga.inflibnet.ac.in:8443/jspui/handle/123456789/15054
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dc.contributor.authorBharathi, R-
dc.contributor.authorSelvarani, R-
dc.date.accessioned2024-04-08T04:11:04Z-
dc.date.available2024-04-08T04:11:04Z-
dc.date.issued2019-
dc.identifier.citationVol. 11, No. 3; pp. 1-25en_US
dc.identifier.issn1942-9045-
dc.identifier.issn1942-9037-
dc.identifier.urihttp://dx.doi.org/10.4018/IJSSCI.2019070101-
dc.identifier.urihttp://gnanaganga.inflibnet.ac.in:8080/jspui/handle/123456789/15054-
dc.description.abstractIn the recent past, automotive industries are concentrating on software controlled automatic functions for its safety operations. The automotive safety and reliability lie in its design, construction, and software implementation. To assess the software reliability, the hidden design errors are classified and quantified. The temporal characteristic of numerical error is analyzed and its probabilistic behavior is explored using a novel framework called software failure estimation with numerical error (SFENE). Here, a model is devised to assess the probability of occurrence of the numerical error and its propagations from the initial to various other states using a Hidden Markov Model. It is seen that the framework SFENE supports classifying and quantifying the behavior of numerical errors while interacting across its system components and aids in the assessment on software reliability at design stage. The sensitivity and precision are found to be satisfactory. This attempt will support in the development of cost effective and error free safety critical software system.en_US
dc.language.isoenen_US
dc.publisherInternational Journal of Software Science and Computational Intelligence-Ijsscien_US
dc.publisherIgi Globalen_US
dc.subjectFailureen_US
dc.subjectFaulten_US
dc.subjectDesign Erroren_US
dc.subjectHmmen_US
dc.subjectPropagationen_US
dc.subjectSafety Criticalen_US
dc.titleSoftware Reliability Assessment of Safety Critical System Using Computational Intelligenceen_US
dc.typeArticleen_US
Appears in Collections:Journal Articles

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