Imagery Improvements in Staring Infrared Imagers By Employing Subpixel Microscan

Abstract

lmagers based on focal plane arrays (FPAs) risk introducing in-band and out-of-band spurious responses, or aliasing, due to under- sampling. IR systems can use microscan (or dither) to reduce aliasing. We describe a generic microscan technique and the benefits of micros- canning, including an analysis of and experiments on four-point micros- can employed in IR imagers, in which the image is mechanically shifted by 1/2 pixel between fields, in each dimension.