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Please use this identifier to cite or link to this item: https://gnanaganga.inflibnet.ac.in:8443/jspui/handle/123456789/7474
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dc.contributor.authorMark Mero-
dc.contributor.authorBenjamin Clapp-
dc.date.accessioned2024-02-27T06:09:41Z-
dc.date.available2024-02-27T06:09:41Z-
dc.date.issued2005-
dc.identifier.urihttp://gnanaganga.inflibnet.ac.in:8080/jspui/handle/123456789/7474-
dc.description.abstractThe physical effects reducing the damage threshold of dielectric films when exposed to multiple femtosecond pulses are investigated. The measured tempe rature increase of a Ta2 O5 film scales exponentially with the pulse fluence. A polarized luminescence signal is observed that depends quadratically on the pulse fluence and is attributed to two- photon excitation of self-trapped excitons that form after band-to-band excitation.-
dc.publisherOptical Engineering-
dc.titleOn the Damage Behavior of Dielectric Films When Illuminated with Multiple Femtosecond Laser Pulses-
dc.volVol. 44-
dc.issuedNo. 5-
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