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Please use this identifier to cite or link to this item: https://gnanaganga.inflibnet.ac.in:8443/jspui/handle/123456789/7475
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dc.contributor.authorShihua Wang-
dc.contributor.authorChenggen Quan-
dc.date.accessioned2024-02-27T06:09:42Z-
dc.date.available2024-02-27T06:09:42Z-
dc.date.issued2005-
dc.identifier.urihttp://gnanaganga.inflibnet.ac.in:8080/jspui/handle/123456789/7475-
dc.description.abstractAn optical micro-shadowgraph for the height measurement of a micro-solderball on a semiconductor wafer is proposed. The micro-shadow image resulting from an oblique illumination onto the protruded solderball/bump on the wafer is clearly captured. Experimental investigation shows that accurate solderball height measurement can be readily obtained.-
dc.publisherOptical Engineering-
dc.titleOptical Micro-Shadowgraph-Based Method for Measuring Micro-Solderball Height-
dc.volVol. 44-
dc.issuedNo. 5-
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