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https://gnanaganga.inflibnet.ac.in:8443/jspui/handle/123456789/14855
Title: | From Historical Backgrounds to Recent Advances in 30 Characterization of Materials- An Overview |
Authors: | Sergio Neves Monteiro Sidnei Paciornik |
Keywords: | Hans and Zacharias Janssen elementary organization. |
Issue Date: | 2017 |
Publisher: | JOM |
Abstract: | Two-dimensional pictures and x-ray diffraction (XRD) patterns have for a long time been the standard techniques most frequently u sed to analyze a material structure. In the past decades, owing to advances in imaging and computer technology, three-dimensional (3D) techniques have provided new insights into how phase distribution, crystallographic interfaces and defect arrangements contribute to build a material structure. Moreover, theoretical modeling is now able to disclose a more accurate structural simulation with the support of 3D characterization. In this work, a concise overview of the major 3D imaging techniques is presented to update the reader with the main related achievements in automated serial sectioning, focused ion beam/scanning electron microscopy (FIB/SEM) and x-ray microtomography (microCT). Examples addressed in the literature for engineering materials illustrate each t technique. |
URI: | http://gnanaganga.inflibnet.ac.in:8080/jspui/handle/123456789/14855 |
Appears in Collections: | Articles to be qced |
Files in This Item:
File | Size | Format | |
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From Historical Backgrounds.pdf Restricted Access | 5.48 MB | Adobe PDF | View/Open Request a copy |
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