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DC Field | Value | Language |
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dc.contributor.author | Sergio Neves Monteiro | - |
dc.contributor.author | Sidnei Paciornik | - |
dc.date.accessioned | 2024-03-02T06:30:29Z | - |
dc.date.available | 2024-03-02T06:30:29Z | - |
dc.date.issued | 2017 | - |
dc.identifier.uri | http://gnanaganga.inflibnet.ac.in:8080/jspui/handle/123456789/14855 | - |
dc.description.abstract | Two-dimensional pictures and x-ray diffraction (XRD) patterns have for a long time been the standard techniques most frequently u sed to analyze a material structure. In the past decades, owing to advances in imaging and computer technology, three-dimensional (3D) techniques have provided new insights into how phase distribution, crystallographic interfaces and defect arrangements contribute to build a material structure. Moreover, theoretical modeling is now able to disclose a more accurate structural simulation with the support of 3D characterization. In this work, a concise overview of the major 3D imaging techniques is presented to update the reader with the main related achievements in automated serial sectioning, focused ion beam/scanning electron microscopy (FIB/SEM) and x-ray microtomography (microCT). Examples addressed in the literature for engineering materials illustrate each t technique. | - |
dc.publisher | JOM | - |
dc.subject | Hans and Zacharias Janssen | - |
dc.subject | elementary organization. | - |
dc.title | From Historical Backgrounds to Recent Advances in 30 Characterization of Materials- An Overview | - |
dc.vol | Vol. 69 | - |
dc.issued | No. 1 | - |
Appears in Collections: | Articles to be qced |
Files in This Item:
File | Size | Format | |
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From Historical Backgrounds.pdf Restricted Access | 5.48 MB | Adobe PDF | View/Open Request a copy |
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