Please use this identifier to cite or link to this item: https://gnanaganga.inflibnet.ac.in:8443/jspui/handle/123456789/14855
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dc.contributor.authorSergio Neves Monteiro-
dc.contributor.authorSidnei Paciornik-
dc.date.accessioned2024-03-02T06:30:29Z-
dc.date.available2024-03-02T06:30:29Z-
dc.date.issued2017-
dc.identifier.urihttp://gnanaganga.inflibnet.ac.in:8080/jspui/handle/123456789/14855-
dc.description.abstractTwo-dimensional pictures and x-ray diffraction (XRD) patterns have for a long time been the standard techniques most frequently u sed to analyze a material structure. In the past decades, owing to advances in imaging and computer technology, three-dimensional (3D) techniques have provided new insights into how phase distribution, crystallographic interfaces and defect arrangements contribute to build a material structure. Moreover, theoretical modeling is now able to disclose a more accurate structural simulation with the support of 3D characterization. In this work, a concise overview of the major 3D imaging techniques is presented to update the reader with the main related achievements in automated serial sectioning, focused ion beam/scanning electron microscopy (FIB/SEM) and x-ray microtomography (microCT). Examples addressed in the literature for engineering materials illustrate each t technique.-
dc.publisherJOM-
dc.subjectHans and Zacharias Janssen-
dc.subjectelementary organization.-
dc.titleFrom Historical Backgrounds to Recent Advances in 30 Characterization of Materials- An Overview-
dc.volVol. 69-
dc.issuedNo. 1-
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