From Historical Backgrounds to Recent Advances in 30 Characterization of Materials- An Overview

Abstract

Two-dimensional pictures and x-ray diffraction (XRD) patterns have for a long time been the standard techniques most frequently u sed to analyze a material structure. In the past decades, owing to advances in imaging and computer technology, three-dimensional (3D) techniques have provided new insights into how phase distribution, crystallographic interfaces and defect arrangements contribute to build a material structure. Moreover, theoretical modeling is now able to disclose a more accurate structural simulation with the support of 3D characterization. In this work, a concise overview of the major 3D imaging techniques is presented to update the reader with the main related achievements in automated serial sectioning, focused ion beam/scanning electron microscopy (FIB/SEM) and x-ray microtomography (microCT). Examples addressed in the literature for engineering materials illustrate each t technique.