Please use this identifier to cite or link to this item:
https://gnanaganga.inflibnet.ac.in:8443/jspui/handle/123456789/14857
Title: | In Situ Tem Scratch Testing of Perpendicular Magnetic Recording Multilayers with a Novel Mems Tribometer |
Authors: | Eric D. Hintsala Douglas D. Stauffer |
Keywords: | widely utilized in storage devices and loss of data. |
Issue Date: | 2017 |
Publisher: | JOM |
Abstract: | Utilizing a newly developed two-dimensional (2D) transducer d esigned forin situ transmission electron microscope (TEM ) nanotribology , d eformationmechanisms of a perpendicular magnetic recording film stack under scratchloading conditions were eva l uated . These types of films are widely utilized instorage devices, and loss of data by grain reorientation in the recording layersis of interest . The observed deformation was characterized by a stick-slipmechanism, which was induced by a critical ratio of lateral to normal forceregardless of normal force. At low applied normal forces, the diamond- l ikecarbon (DLC) coating and asperities in the recording layer were remove dduring scratching, while, at higher applied forces , grain reorientation anddebonding of the recording layer was observed . As the normal force and dis-placement were increased, work for stick-slip deformation and contact stresswere found to increase based upon an Archard 's Law analysis. These experi-ments also served as an initial case study demonstrating the capabilities ofthis new transducer. |
URI: | http://gnanaganga.inflibnet.ac.in:8080/jspui/handle/123456789/14857 |
Appears in Collections: | Articles to be qced |
Files in This Item:
File | Size | Format | |
---|---|---|---|
In Situ TEM Scratch Testing.pdf Restricted Access | 3.17 MB | Adobe PDF | View/Open Request a copy |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.