Please use this identifier to cite or link to this item: https://gnanaganga.inflibnet.ac.in:8443/jspui/handle/123456789/14857
Title: In Situ Tem Scratch Testing of Perpendicular Magnetic Recording Multilayers with a Novel Mems Tribometer
Authors: Eric D. Hintsala
Douglas D. Stauffer
Keywords: widely utilized in storage devices
and loss of data.
Issue Date: 2017
Publisher: JOM
Abstract: Utilizing a newly developed two-dimensional (2D) transducer d esigned forin situ transmission electron microscope (TEM ) nanotribology , d eformationmechanisms of a perpendicular magnetic recording film stack under scratchloading conditions were eva l uated . These types of films are widely utilized instorage devices, and loss of data by grain reorientation in the recording layersis of interest . The observed deformation was characterized by a stick-slipmechanism, which was induced by a critical ratio of lateral to normal forceregardless of normal force. At low applied normal forces, the diamond- l ikecarbon (DLC) coating and asperities in the recording layer were remove dduring scratching, while, at higher applied forces , grain reorientation anddebonding of the recording layer was observed . As the normal force and dis-placement were increased, work for stick-slip deformation and contact stresswere found to increase based upon an Archard 's Law analysis. These experi-ments also served as an initial case study demonstrating the capabilities ofthis new transducer.
URI: http://gnanaganga.inflibnet.ac.in:8080/jspui/handle/123456789/14857
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