Ultrasonic Spray Pyrolysis Deposition of Sds Surfactant Assisted Copper Oxide Thin Films

Abstract

IIn this paper an attempt has been made to study the impact of surfactant on the properties of the ultrasonically spray deposited CuO fl/ms, An aqueous solution of cupric nitrate tr/hydrate (Cu(NO:J2,3HPJ modified with Sodium Dodecyl Sulphate (SOS) surfactant Is used to deposit CuO films on glass substrate by Ultrasonic spray pyrolysis technique, The X'Pert Panlyt/cal Diffractometer was employed for the phase identification of the fl/ms using Cu Ka radiation (A = 1.5405 A, 30mA, 40 kV) in 20 range from 30-80°. The Field Emission Scanning Electron Micrographs (FESEMJ and EDAX (Energy Dispersive Analysis of X-rays) spectrum were recorded on JEOL JSM-6700F Scanning Electron Microscope with a beam voltage of 30 kV. The depth profiler (Dektek 3030 XT) was employed for monitoring the film thickness and was found to be 400 ± 20 nm. The X-Ray Diffraction (XRDJ studies of the fl/ms deposited at various substrate temperatures Indicate the formation of monoclinic CuO with preferential orientation along the(002) plane for all samples, Surfactant modified films showed an Increase in crystallite size of 35 nm at substrate temperature of 300 ·c. The Scanning Electron Micrograph (FESEMJ confirms the uniform distribution of facets like grains on the entire area of substrate. The results obtained In this study Illustrate that SOS modified films show a significant reduction in the particle agglomeration thereby increasing the surface to volume ratio which In turn Improves their sensing performance.